Field-ion microscopy observation of single-walled carbon nanotubes

Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observe the end structure of single-walled carbon nanotubes (SWCNTs). FIM images revealed the existence of open SWCNT ends. Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failed to remove them. Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles. Carbon and oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed on the SWCNT ends.