Cite this article:
Xie Tian, Zheng Dai-Shun, Li Xiao-Hong, Ma Yun-Gui, Wei Fu-Lin, Yang Zheng. Study of nanocrystalline Fe-Al-N soft magnetic thin filmsJ. Chin. Phys. B, 2002, 11(7): 725-729.
| Xie Tian, Zheng Dai-Shun, Li Xiao-Hong, Ma Yun-Gui, Wei Fu-Lin, Yang Zheng. Study of nanocrystalline Fe-Al-N soft magnetic thin filmsJ. Chin. Phys. B, 2002, 11(7): 725-729. |
Study of nanocrystalline Fe-Al-N soft magnetic thin films
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Abstract
Fe-Al-N films were fabricated by reactive sputtering using a radio-frequency magnetron sputtering system. The effects of Al and N content and annealing temperature on microstructure and magnetic properties were investigated. The Fe-Al-N films, which have good soft magnetic properties, consist of nanocrystalline α-Fe grains and a small amount of other phases in the boundaries of \alpha-Fe grains. The average \alpha-Fe grain size is about 10-15nm. A slight amount of Fe-N and Al-N compounds precipitate in the boundaries of \alpha-Fe grains and suppress their growth. Annealing improves the soft magnetic properties slightly by releasing the residual stress and reducing defects. -
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