Print ISSN:1674-1056  |  Online ISSN:2058-3834  |  CN:11-5639/O4
  • Cite this article:

    Wang Zhong-chun, Li Zhi-yong, Chen Xiao-feng, Hu Xing-fang. X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V2O5 THIN FILMJ. Chin. Phys. B, 1999, 8(1): 57-62.
    Wang Zhong-chun, Li Zhi-yong, Chen Xiao-feng, Hu Xing-fang. X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V2O5 THIN FILMJ. Chin. Phys. B, 1999, 8(1): 57-62.
  • X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V2O5 THIN FILM

    • Nanocrystalline V2O5 thin films were reactively radio-frequency magnetron-sputtered under optimal deposition parameters. Their electrochemical and electrochromic characteristics were investigated by cyclic voltammetry and in-situ monochromatic transmittance measurements. Upon lithium intercalation, V2O5 thin films showed a double electrochromic behavior depending on the wavelength and the intercalation extent. X-ray photoelectron spectroscopy results showed that part of the V5+ in V2O5 was reduced to V4+ during the Li+ intercalation process.
    • Article Text

    • loading

    Catalog

      /

      DownLoad:  Full-Size Img  PowerPoint
      Return
      Return