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    LI ZHAN-JIE, XIONG YUAN-SHENG, LIU ZU-LI, YAO KAI-LUN. TOTAL REFLECTION CHARACTERISTICS OF PLANE WAVES AT THE INTERFACE INCLUDING A CHIRAL MEDIUMJ. Chin. Phys. B, 1998, 7(6): 432-436.
    LI ZHAN-JIE, XIONG YUAN-SHENG, LIU ZU-LI, YAO KAI-LUN. TOTAL REFLECTION CHARACTERISTICS OF PLANE WAVES AT THE INTERFACE INCLUDING A CHIRAL MEDIUMJ. Chin. Phys. B, 1998, 7(6): 432-436.
  • TOTAL REFLECTION CHARACTERISTICS OF PLANE WAVES AT THE INTERFACE INCLUDING A CHIRAL MEDIUM

    • The total reflection characteristics of plane waves from the interfac e including a chiral medium have been studied with complex chiral material param eters. The possible values of chirality admittance \zetac are determined for left-circularly polarized (LCP) and right-circularly polarized (RCP) total reflections at fixed incident angles from an interface between free space and a chiral medium. It is found that there exists a region of parameter \zetac , in which neither LCP nor RCP modes can be totally reflected for any incident angle \theta. It is demonstrated that for \zeta1 = Re (\zetac)>0, total reflection is preferred for LCP mode whereas RCP total reflection is favored for \zeta1<0.
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