Cite this article:
BA LONG, ZENG JIAN-LIN, ZHANG SHU-YUAN, WU ZI-QIN. MICROSTRUCTURE AND FRACTAL FORMATION OF ANNEALED Ge-Au FILM AND Ge-Au/Au BILAYER FILMSJ. Chin. Phys. B, 1996, 5(7): 530-537.
| BA LONG, ZENG JIAN-LIN, ZHANG SHU-YUAN, WU ZI-QIN. MICROSTRUCTURE AND FRACTAL FORMATION OF ANNEALED Ge-Au FILM AND Ge-Au/Au BILAYER FILMSJ. Chin. Phys. B, 1996, 5(7): 530-537. |
MICROSTRUCTURE AND FRACTAL FORMATION OF ANNEALED Ge-Au FILM AND Ge-Au/Au BILAYER FILMS
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Abstract
The as-deposited and annealed Ge-Au film and Ge-Au/Au bilayer films have been observed by transmission electron microscopy. The bilayer with a composition of Ge-5at%Au film is amorphous, while the Ge-22at%Au film is polycrystalline. Higher concentration of Au raises the structural heterogeneity and instability. Fractals can be observed in the Ge-5at%Au/Au bilayer samples annealed at 60-100℃. The difference of the fractal patterns generated from Ge-Au/An and a-Ge/Au films call be attributed to the higher heterogeneity and instability in Ge-Au/An bilayers. -
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