Investigation of dimensionality in superconducting NbN thin film samples with different thicknesses and NbTiN meander nanowire samples by measuring the upper critical field

Nazir Mudassar^{1, 2}, Yang Xiaoyan³, Tian Huanfang¹, Song Pengtao^{1, 2}, Wang Zhan^{1, 2}, Xiang Zhongcheng¹, Guo Xueyi¹, Jin Yirong¹, You Lixing³, Zheng Dongning^{1, 2, 4, †}

Temperature dependence of the perpendicular upper critical field results for the ultra-thin NbN and the NbTiN nanowire samples. Bending curvature close to T_c is observed and the red solid lines are the fitted curves using a (1−t)^γ relation.