Investigation of dimensionality in superconducting NbN thin film samples with different thicknesses and NbTiN meander nanowire samples by measuring the upper critical field

Nazir Mudassar^{1, 2}, Yang Xiaoyan³, Tian Huanfang¹, Song Pengtao^{1, 2}, Wang Zhan^{1, 2}, Xiang Zhongcheng¹, Guo Xueyi¹, Jin Yirong¹, You Lixing³, Zheng Dongning^{1, 2, 4, †}

(a) Normalization of resistance as a function of temperature curves for different micro-bridges at zero fields. Inset: R–T is measured from 2 K to 300 K. (b) Thickness dependence of the transition temperature. The black solid symbols are experimental data and the red solid line is to guide the eyes.