Investigation of dimensionality in superconducting NbN thin film samples with different thicknesses and NbTiN meander nanowire samples by measuring the upper critical field

Nazir Mudassar^{1, 2}, Yang Xiaoyan³, Tian Huanfang¹, Song Pengtao^{1, 2}, Wang Zhan^{1, 2}, Xiang Zhongcheng¹, Guo Xueyi¹, Jin Yirong¹, You Lixing³, Zheng Dongning^{1, 2, 4, †}

XRD characterization of NbN 100 nm thin film.