High crystalline quality of SiGe fin fabrication with Si-rich composition area using replacement fin processing
Zan Ying, Li Yong-Liang, Cheng Xiao-Hong, Zhao Zhi-Qian, Liu Hao-Yan, Hu Zhen-Hua, Du An-Yan, Wang Wen-Wu
       

SMF images of SiGe SEG from bottom to top along fin direction, for (a) Si substrate, (b) SiGe between STI oxides.