High-efficiency photon–electron coupling resonant emission in GaN-based microdisks on Si

Liu Menghan¹, Chen Peng^{1, †}, Xie Zili¹, Xiu Xiangqian¹, Chen Dunjun¹, Liu Bin¹, Han Ping¹, Shi Yi¹, Zhang Rong^{1, ‡}, Zheng Youdou¹, Cheng Kai², Zhang Liyang²

Radial electric field profiles (|E|²) of (a) 3.3 μm microdisk at 444 nm, (b) 8 μm microdisk at 440 nm and (c) 18 μm microdisk at 446 nm.