Lattice deformation in epitaxial Fe<sub>3</sub>O<sub>4</sub> films on MgO substrates studied by polarized Raman spectroscopy

Lattice deformation in epitaxial Fe₃O₄ films on MgO substrates studied by polarized Raman spectroscopy

Yang Yang^{1, †}, Zhang Qiang², Mi Wenbo³, Zhang Xixiang²

(a) bandwidth and (b) correlation length for T2g(1) mode as a function of thickness. The inset shows the thickness dependence of the ratio of half-widths at half maximum on low- and high-frequency sides (Γ_l/Γ_h).