Structural and optical characteristic features of RF sputtered CdS/ZnO thin films
Al-Baradi Ateyyah M1, †, Altowairqi Fatimah A1, Atta A A1, 2, Badawi Ali1, Algarni Saud A1, Almalki Abdulraheem S A3, Hassanien A M4, Alodhayb A5, Kamal A M6, El-Nahass M M2
       

FESEM micrographs of as-deposited and thermally annealed CdS/ZnO thin films as a function of temperatures: (a) as-deposited film, (b) annealed film at 373 K, (c) annealed film at 473 K, and (d) annealed film at 573 K.