Simulation study of high voltage GaN MISFETs with embedded PN junction
Fei Xin-Xing1, Wang Ying2, †, Luo Xin1, Yu Cheng-Hao2
       

Plot of optimized VBK and RON versus LGN with LGN ranging from 3 μm to 14 μm and NN+ bing 1× 1019 cm−3.