Influence comparison of N2 and NH3 nitrogen sources on AlN films grown by halide vapor phase epitaxy
Chen Jing-Jing1, 2, Huang Jun1, Su Xu-Jun1, Niu Mu-Tong1, Xu Ke1, 2, 3, †
       

The FWHMs of (0002) and (101¯2 ) plane XRCs for as-grown AlN films. The samples grown with different nitrogen sources are shown in different colors.