Tuning the alignment of pentacene on copper substrate by annealing-assistant surface functionalization
Cao Qiao-Jun1, Wen Shuang1, Xie Hai-Peng2, Shi Bi-Yun1, Wang Qun1, Lu Cong-Rong1, Gao Yongli3, Dou Wei-Dong1, ‡
       

Morphology and structure of pentacene film of thick layer on LPC and HPC substrates: AFM images of pentacene on LPC (a) and HPC (b) substrates show XRD results of pentacene films on LPC (c) and HPC (d) substrates. The scale bar in both of the AFM images is 1 μm for both panels (a) and (b). The nominal thickness of pentacene is 50 nm for both cases.