Uncovering the internal structure of five-fold twinned nanowires through 3D electron diffraction mapping
High-resolution TEM image of T4 segment oriented to [010] zone-axis showing irregular spaced stacking faults (SF).
Uncovering the internal structure of five-fold twinned nanowires through 3D electron diffraction mapping |
High-resolution TEM image of T4 segment oriented to [010] zone-axis showing irregular spaced stacking faults (SF). |
| |