Determination of activation energy of ion-implanted deuterium release from W-Y2O3
Wang Xue-Feng1, 2, Wu Ji-Liang2, Li Qiang2, Yang Rui-Zhu2, Wang Zhan-Lei2, Chen Chang-An2, Feng Chun-Rong1, 2, Rao Yong-Chu2, Chen Xiao-Hong1, †, Ye Xiao-Qiu2, ‡
       

NRA determined deuterium depth profile (topmost 2000 nm) for W and W–Y2O3 exposed to deuterium plasma.