Ultraviolet irradiation dosimeter based on persistent photoconductivity effect of ZnO

Wang Chao-Jun^{1, 2}, Yang Xun^{1, 2, †}, Zang Jin-Hao^{1, 2}, Chen Yan-Cheng^{1, 2}, Lin Chao-Nan^{1, 2}, Liu Zhong-Xia², Shan Chong-Xin^{1, 2, ‡}

Relationship between photocurrent and accumulative UV exposure of the ZnO MW device. (a) Time-resolved photocurrent increase under different UV light intensity of the ZnO MW device. (b) The relationships between photocurrent and UV accumulation, obtained from the same data in (a). (c) The mean UV accumulation and corresponding relative standard deviation versus photocurrent. All measurements were performed at 5 V bias.