Ultraviolet irradiation dosimeter based on persistent photoconductivity effect of ZnO
Wang Chao-Jun1, 2, Yang Xun1, 2, †, Zang Jin-Hao1, 2, Chen Yan-Cheng1, 2, Lin Chao-Nan1, 2, Liu Zhong-Xia2, Shan Chong-Xin1, 2, ‡
       

Characterizations of the ZnO MWs. (a) XRD patterns of the ZnO MWs. The inset shows the schematic diagram of the ZnO MW based device. (b) SEM images of a single ZnO MW. The inset shows an enlarged SEM image of the surfaces. (c) PL spectrum of the ZnO MW.