Single-order soft x-ray spectra with spectroscopic photon sieve
(a) Calculated far-field SPS diffraction pattern at 1 nm, and (b) intensity profile of typical diffraction patterns of 1 : 1 TG and SPS at 1 nm.
Single-order soft x-ray spectra with spectroscopic photon sieve |
(a) Calculated far-field SPS diffraction pattern at 1 nm, and (b) intensity profile of typical diffraction patterns of 1 : 1 TG and SPS at 1 nm. |
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