Characteristics of AlGaN/GaN high electron mobility transistors on metallic substrate
Zhao Minglong1, 2, 3, Tang Xiansheng1, 2, 3, Huo Wenxue1, 2, 3, Han Lili1, 2, 3, Deng Zhen1, 3, 5, Jiang Yang1, 3, Wang Wenxin1, 3, 4, Chen Hong1, 3, 4, Du Chunhua1, 3, 5, Jia Haiqiang1, 3, 4, †
       

Thermoreflectance imaging of (a) GaN-on-Si HEMT and (b) GaN-on-Cu HEMT at VDS = 12 V.