Characteristics of AlGaN/GaN high electron mobility transistors on metallic substrate
Zhao Minglong1, 2, 3, Tang Xiansheng1, 2, 3, Huo Wenxue1, 2, 3, Han Lili1, 2, 3, Deng Zhen1, 3, 5, Jiang Yang1, 3, Wang Wenxin1, 3, 4, Chen Hong1, 3, 4, Du Chunhua1, 3, 5, Jia Haiqiang1, 3, 4, †
       

AFM scanning images of GaN HEMTs (a) on Si substrate and (b) on Cu substrate. (c) The Raman spectra of the two HEMT chips.