Ab initio calculations on oxygen vacancy defects in strained amorphous silica
Zhou Bao-Hua1, †, Zhang Fu-Jie1, Liu Xiao1, Song Yu2, 3, Zuo Xu1, 4, ‡, ‡
       

Calculated stress plotted versus the applied strain to the a-SiO2 model. The black and red lines represent the total stress and the stress in Z direction, respectively. The a-SiO2 model is illustrated in the inset.