Developing cold-resistant high-adhesive electronic substrate for WIMPs detectors at CDEX

Liu Yuanyuan^{1, 2}, Cheng Jianping^{1, 2}, Pang Pan², Liao Bin^{1, 2, †}, Wu Bin^{1, 2, ‡}, Ying Minju^{1, 2}, Zhang Fengshou^{1, 2}, Chen Lin², Lv Shasha^{1, 2}, Liu Yandong^{1, 2}, Sun Tianxi^{1, 2}

Monte Carlo simulation of ion implantation. The simulation setup is shown in panel (a), where a stream of 9-keV Ni⁺ ion is employed to bombard a composite laminate composed of a 5-nm Ni transition layer stacking on top of the PTFE layer. The simulation results on distribution of atoms along the ion incoming direction are shown in panel (b). Note that only the atoms which are removed from their initial positions are incorporated for statistical counting.