Influence of Zr50Cu50 thin film metallic glass as buffer layer on the structural and optoelectrical properties of AZO films<xref rid="cpb_29_3_037303fn1" ref-type="fn">*</xref><fn id="cpb_29_3_037303fn1"><label>*</label>Project supported by the National Natural Science Foundation of China (Grant No. 51571085), the Key Science and Technology Program of Henan Province, China (Grant No. 19212210210), the Foundation of Henan Educational Committee, China (Grant No. 13B430019), and the Henan Postdoctoral Science Foundation, China.</fn>

Influence of Zr₅₀Cu₅₀ thin film metallic glass as buffer layer on the structural and optoelectrical properties of AZO films**

Project supported by the National Natural Science Foundation of China (Grant No. 51571085), the Key Science and Technology Program of Henan Province, China (Grant No. 19212210210), the Foundation of Henan Educational Committee, China (Grant No. 13B430019), and the Henan Postdoctoral Science Foundation, China.

Zhang Bao-Qing¹, Liu Gao-Peng¹, Zong Hai-Tao^{2, †}, Fu Li-Ge², Wei Zhi-Fei¹, Yang Xiao-Wei¹, Cao Guo-Hua^{2, ‡}

X-ray diffraction patterns of AZO/ZrCu films deposited at different substrate temperatures.