Breakdown voltage enhancement in GaN channel and AlGaN channel HEMTs using large gate metal height
Wang Zhong-Xu1, Du Lin2, Liu Jun-Wei1, Wang Ying3, Jiang Yun2, Ji Si-Wei2, Dong Shi-Wei3, Chen Wei-Wei3, Tan Xiao-Hong4, Li Jin-Long4, Li Xiao-Jun3, Zhao Sheng-Lei1, †, Zhang Jin-Cheng1, †, Hao Yue1
       

Logarithmic electron concentration distribution in GaN channel HEMTs with εr = 28, t = 0.5 μm, VDS = 200 V, and (a) h = 0.2 μm or (b) h = 0.4 μm.