Optical and electrical properties of InGaZnON thin films*

Project supported by the National Natural Science Foundation of China (Grant No. 61674107), Shenzhen Key Lab Fund, China (Grant No. ZDSYS 20170228105421966), and Science and Technology Plan of Shenzhen, China (Grant No. JCYJ20170302150335518).

Yao Jian Ke, Ye Fan, Fan Ping
       

The O 1s XPS spectra of IGZON thin films deposited at (a) PN2 of 10% and Ts of RT, 300 °C, and 400 °C; (b) PN2 of 20% and Ts of RT, 300 °C, and 400 °C. N 1s XPS spectra of IGZON thin films deposited at (c) PN2 of 10% and Ts of RT, 300 °C, and 400 °C; (d) PN2 of 20% and Ts of RT, 300 °C, and 400 °C.