Probing the minigap in topological insulator-based Josephson junctions under radio frequency irradiation Project supported by the National Basic Research Program of China (Grant Nos. 2016YFA0300601, 2017YFA0304700, and 2015CB921402), the National Natural Science Foundation China (Grant Nos. 11527806, 91221203, 11174357, 91421303, and 11774405), and the Strategic Priority Research Program B of the Chinese Academy of Sciences (Grant Nos. XDB07010100 and XDB28000000), and the Beijing Municipal Science & Technology Commission, China (Grant No. Z191100007219008). |
Shapiro maps in an Al–Bi2Te3–Al junction. (a) Differential resistance dVJ/dIJ as a function of rf power Prf and direct bias current IJ, measured at rf frequency frf = 0.5 GHz. (b) The same data as in (a), but replotted as a function of rf power Prf and direct voltage VJ across the junction in units of hfrf/2e. Evenly spaced Shapiro steps can be seen. (c) Simulated dVJ/dIJ based on the RSJ model. (d) The same simulated dVJ/dIJ as shown in (c), but in a wider range of rf power. The black line represents the critical supercurrent Ic, and the red curve represents the sum of the critical supercurrent Ic and the amplitude of the rf-driving current Irf0. |