Plasmon reflection reveals local electronic properties of natural graphene wrinkles<xref rid="cpb_28_11_117302fn1" ref-type="fn">*</xref><fn id="cpb_28_11_117302fn1"><label>*</label><p>Project supported by the National Key Research and Development Program of China (Grant No. 2016YFA0203500), the National Natural Science Foundation of China (Grant No. 11874407), and Strategic Priority Research Program of Chinese Academy of Sciences (Grant No. XDB 30000000).</p></fn>

Plasmon reflection reveals local electronic properties of natural graphene wrinkles**

Project supported by the National Key Research and Development Program of China (Grant No. 2016YFA0203500), the National Natural Science Foundation of China (Grant No. 11874407), and Strategic Priority Research Program of Chinese Academy of Sciences (Grant No. XDB 30000000).

Chen Runkun¹, Yang Cui¹, Jia Yuping^{2, 3}, Guo Liwei^{4, 5, 6, †}, Chen Jianing^{1, 6, ‡}

Near field infrared imaging of graphene plasmons on SiC substrate. (a) The schematic diagram of s-SNOM experiment. (b) AFM topography image of graphene wrinkles on SiC substrate. (c) The corresponding infrared near field amplitude image of (b) at the frequency of 1000 cm⁻¹. The scale bar is 500 nm.