Single event upset on static random access memory devices due to spallation, reactor, and monoenergetic neutrons
Jin Xiao-Ming †, Chen Wei, Li Jun-Lin, Qi Chao, Guo Xiao-Qiang, Li Rui-Bin, Liu Yan
       

Plots of simulated SEU cross-section versus critical charge for four types of neutron energy: (a) XARP neutrons, (b) CSNS neutrons, (c) 2.5-MeV neutrons, and (d) 14-MeV neutrons.