Single event upset on static random access memory devices due to spallation, reactor, and monoenergetic neutrons
Jin Xiao-Ming
†
, Chen Wei
, Li Jun-Lin
, Qi Chao
, Guo Xiao-Qiang
, Li Rui-Bin
, Liu Yan
Circuit of SRAM cell: (a) equivalent circuit and (b) circuit of six-transistors cell.