Single event upset on static random access memory devices due to spallation, reactor, and monoenergetic neutrons

Jin Xiao-Ming^†, Chen Wei, Li Jun-Lin, Qi Chao, Guo Xiao-Qiang, Li Rui-Bin, Liu Yan

Contribution of secondary ion species to SEU for different neutron spectra: (a) 500-nm SRAM, (b) 350-nm SRAM, (c) 130-nm SRAM, (d) 90-nm SRAM, (e) 65-nm SRAM, and (f) 40-nm SRAM.