Performance improvement of 4H-SiC PIN ultraviolet avalanche photodiodes with different intrinsic layer thicknesses
Cai Xiaolong1, 2, Zhou Dong1, Cheng Liang1, Ren Fangfang1, Zhong Hong2, Zhang Rong1, Zheng Youdou1, Lu Hai1, †
       

(a) Cross-sectional schematic diagram of the 4H-SiC p–i–n APD. (b) The top view image of one fabricated SiC APD.