Techniques of microwave permeability characterization for thin films
(a) Side and (b) back view of the designed shorted microstrip line probe, (c) schematic diagram of high temperature magnetic spectrum testing device.[
Techniques of microwave permeability characterization for thin films |
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(a) Side and (b) back view of the designed shorted microstrip line probe, (c) schematic diagram of high temperature magnetic spectrum testing device.[ |
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