Structural transitions in NaNH<sub>2</sub> via recrystallization under high pressure

Structural transitions in NaNH₂ via recrystallization under high pressure

Huang Yanping^†, Haung Xiaoli^‡, Wang Xin^§, Zhang Wenting, Zhou Di, Zhou Qiang, Liu Bingbing, Cui Tian

(a) Representative angle dispersive x-ray diffraction patterns of NaNH₂ during compression to 16.52 GPa at room temperature. The Miller indexes ( hkl ) of the diffraction pattern peaks of ambient NaNH₂ phase are shown by the numbers under the first pattern. (b) The XRD rings of the sample at 0.05 GPa, 2.25 GPa, and 16.52 GPa respectively.