3.1. Mode-hop-free and frequency stabilized laser operationBased on our previous work on the modeling of the sufficient condition of stable single frequency laser operation with energy transfer upconversion and excited stimulated absorption taken into account,[23] and considering the power requirement for building the multi-partite entanglements and squeezed states, an output coupler (M5 in the laser cavity) with a transmission of 1.3% at
and a transmission higher than 99.5% at 532 nm, as well as an LBO temperature of 149.2 °C, which leads to a nonlinear conversion coefficient of 1.346 × 10−10 m2/W that is far beyond the critical value of 0.373 × 10−11 m2/W, were chosen for the generation of the dual-wavelength laser. Figure 2 shows the measured input–output behavior of the laser and the longitudinal mode spectrum. The results indicate that the 532 nm and
outputs as high as 9.5 W and 3.1 W are achieved simultaneously under 50 W pumping, and there is only one longitudinal mode oscillated stably with no mode hop. The beam quality of the dual wavelength lasers was also measured using a laser beam quality analyzer (model: M2-200-BB; CCD: GRAS-20S4M-C, Spricon), the beam quality factors of the
laser were
and
. The beam quality factors of the 532 nm laser were
and
. The beam spot radius of the 532 nm laser 0.3 m apart from the cavity was about
, the near-field divergence angle of the 532 nm laser was 5.9 mrad.
By using a digital oscilloscope (model: DPO7245, Tektronix) and a software based on Labview, the laser frequency deviation from the initial frequency as a function of time was measured and shown in Fig. 33(a). It can be seen that the peak to peak frequency drift of the free running laser during 5 h was about ± 4.8 MHz with no mode hop observed. To further stabilize the laser frequency, a 200 mm-long confocal F–P2 cavity, which was consisted with a tube-shaped invar body and two concave end mirrors with curvature radii of 200 mm, was built as a frequency standard. The finesse of the cavity was measured to be 1000, leading to a linewidth of 375 kHz. Since a temperature fluctuation of the invar body as low as 0.1 °C will cause the resonant frequency to drift within 20 MHz, an active temperature control system was designed and employed to maintain the length of the F–P2 cavity. The invar tube body was embedded in a copper sheath with an exterior contour of cuboid, whose four side faces were in close contact with eight pieces of thermoelectric cooler (TEC) modules (40 mm × 20 mm), and covered by an intermediate polyarylsulfone thermal insulation layer and an outermost aluminum shell acting as heat sink. With the help of a homemade temperature controller, a long term temperature stability of ±0.003 °C during 5 h was achieved. Based on this robust frequency reference, Pound–Drever–Hall (PDH) frequency locking was demonstrated via a frequency stabilization loop (FSL) as shown in Fig. 1. The fundamental laser beam was firstly phase modulated by an electro-optic modulator (EOM) to generate frequency-modulated sidebands which were 80 MHz apart from the carrier. Then the laser reflected from the F–P2 cavity was detected by a photo-detector (PD2), and the detected signal was multiplied with the local oscillator’s signal using a mixer (M) with a phase compensation provided by a delay box. After being filtered by a low-pass filter (LPF), the error signal was obtained and sent to a proportional-integral-derivative (PID) amplifier and a high voltage amplifier (HV) to drive the laser PZT1. Figure 3(b) shows the frequency drifts of the stabilized laser during 5 h. Once FSL was working, the long term peak to peak frequency drift was less than ±1.5 MHz.
3.2. Intensity noise suppression and power stabilizationTo stabilize the output power and suppress the intensity noise of the 532 nm laser, a MZI and the corresponding power stabilization loop (PSL) as shown in Fig. 1 were used. The MZI was composed of two HR coated mirrors M12, M13 and two beam splitters (BSs) M10, M11 with a beam splitting ratio of R at 532 nm. The mirror M12 was attached on a PZT3 for tuning the optical length difference (OPD) between the two arms of the MZI. Then the difference between an adjustable low noise direct current (dc) signal and the low frequency part (dc to 40 kHz) of the detected signal from PD5 was filtered by a LPF and sent to a PID and a HV to generate the driving signal, which was finally fed back to PZT3 for locking the OPD. When the voltage of the dc signal was adjusted and the parameters of the proportional-integral-derivative amplifier were tuned accordingly, the transmission of the stabilized laser passing through the MZI (Tlock) can be changed. To investigate the influence of the MZI parameters, e.g., Tlock and R, on the laser noise properties in the audio frequency region (0.4–30 kHz), the same settings were adopted during the following measurements: Firstly, the laser power incident on PD4 and PD5 was kept at
. Secondly, the sectional measurements in four Fourier frequency windows including 0.4–0.8 kHz, 0.8–3.2 kHz, 3.2–10 kHz, and 10–30 kHz were carried out for each noise spectrum, and the resolution bandwidths (video bandwidths) of SA in the respective regions were set as 2 Hz (2 Hz), 4 Hz (4 Hz) 16 Hz (4 Hz), and 16 Hz (4 Hz). Thirdly, to reduce the measurement errors, each data point in Figs. 4 and 5 was the averaged value of the data recorded in 400, 400, 800, and 800 measurements for the four Fourier frequency windows. Fourthly, since the electronic noise was at least 10 dB below the SNL in the frequency region, it had already been subtracted from the measured data.
To investigate the influence of Tlock on the laser intensity noise property, the BSs with R = 50% were used to build the MZI, and the noise spectra were recorded when the OPD of the MZI was locked at different Tlock, as shown in Fig. 4. Curves (i) and (ii) are the SNL and intensity noise of the 532 nm laser before the MZI. It can be seen that in the audio frequency region from 0.4 kHz to 30 kHz, the intensity noise of the laser was always higher than the SNL with a difference ranging from 12 dB to 34 dB. Once the 532 nm laser was stabilized using the MZI and PSL, a noise transfer phenomenon was observed. Curves (iii), (iv), and (v) in Fig. 4 are the intensity noises in the laser output from the locked MZI when Tlock is 45%, 65%, and 85%, respectively. It can be seen that most of the intensity noise in the laser output from the MZI in the frequency region from 0.7 kHz to 10 kHz was suppressed in all the three cases, while the intensity noise in the frequency region from 10 kHz to 30 kHz was raised up beyond the intensity noise of laser before MZI. Moreover, the amount of noise suppression in the frequency region of 0.7–10 kHz can be adjusted by controlling the locking position of the MZI. As shown in Fig. 4, when Tlock was raised up from 45% to 85%, the intensity noise of the laser from 0.7 kHz to 10 kHz was closer to the SNL. In particular, in the analysis frequency region from 0.7 kHz to 3.7 kHz, the intensity noise of laser in the case of Tlock = 85% was more than 5 dB below that in the case of Tlock = 45%.
To test the influence of the beam splitting ratio on the intensity noise of the 532 nm laser, three MZIs with R = 90%, 75%, and 50% were used for 532 nm laser stabilization. Figure 5 shows the measured intensity noises of the laser before the MZI and the stabilized lasers output from the MZIs locked at the same Tlock of 85%. Curves (i) and (ii) are the SNL and intensity noise of the laser before the MZI. Curves (iii), (iv), and (v) are the intensity noises of the lasers output from the locked MZIs when R is 50%, 70%, and 90%, respectively. It can be seen that when the BSs with R = 90% were used to build the MZI, the intensity noise of the stabilized laser in the frequency region from 0.4 kHz to 3 kHz was further suppressed in comparison with the case of R = 50%, while the intensity noise of the stabilized laser in the frequency region from 3 kHz to 30 kHz became higher.
The influence of laser frequency stabilization on the intensity noise suppression was also measured and shown in Fig. 6. Curves (i) and (ii) are the SNLs of the laser with and without laser frequency stabilization, respectively. Curves (iii) and (iv) are the intensity noises of the laser before the MZI with and without laser frequency stabilization, respectively. Curves (v) and (vi) are the intensity noises of the lasers output from the locked MZIs with and without laser frequency stabilization when R is 90% and Tlock is 85%, respectively. It can be seen that the laser frequency stabilization had nearly no influence on the measured SNL and the intensity noise of the laser before MZI. But the intensity noise of the laser after MZI showed significant suppression in the frequency region from 0.4 kHz to 1.3 kHz once the laser was frequency stabilized.
From the above experiment results, the best noise performance was achieved when the laser was frequency stabilized, the MZI with R = 90% was employed and locked to the state of Tlock = 85%. The performance of laser power stability at the same condition was also measured, as shown in Fig. 7. The measured peak to peak power fluctuation of the 532 nm laser before MZI was less than ±0.7% for a given 5 h. As a comparison, when the 532 nm laser was stabilized via an MZI, the 532 nm output power from the locked MZI was 7.5 W, and the measured peak to peak power fluctuation of laser was less than ±0.2% for a given 5 h.