AFM images showing the morphologies of VOPc thin films. (a) 80-nm VOPc grown on the SiO₂ substrate with an RMS of 5.63 nm, (b) 160-nm VOPc grown on the SiO₂ substrate with an RMS of 11.06 nm, (c) 160-nm VOPc grown on the kapton substrate with an RMS of 12.02 nm, (d) 80-nm VOPc grown by PTCDA templating on the SiO₂ substrate with an RMS of 5.54 nm, (e) 160-nm VOPc grown by PTCDA templating on the SiO₂ substrate with an RMS of 8.31 nm, and (f) 160-nm VOPc grown by PTCDA templating on the kapton substrate with an RMS of 10.61 nm. The height profile in each case corresponds to the black lines in the images.