Energy band alignment at Cu
2
O/ZnO heterojunctions characterized by
in situ
x-ray photoelectron spectroscopy
Zhao Yan
, Yin Hong-Bu
, Fu Ya-Jun
, Wang Xue-Min
, Wu Wei-Dong
†
XRD
θ
−
2
θ
scan patterns of 100-nm-Cu
2
O/100 nm-ZnO/
c
-Al
2
O
3
.
