Thermal conductivity characterization of ultra-thin silicon film using the ultra-fast transient hot strip method
Zhang Yan-Yan1, Cheng Ran1, Ni Dong2, Tian Ming3, Lu Ji-Wu4, †, Zhao Yi1
       

Geometrical parameter γ is related to the measurement structure, and (a) γ = 4, (b) γ = 2, (c) γ = 2, (d) γ =1 for the structures shown.