Secondary electron yield suppression using millimeter-scale pillar array and explanation of the abnormal yield

Secondary electron yield suppression using millimeter-scale pillar array and explanation of the abnormal yield–energy curve

Ye Ming^{1, 2, †}, Feng Peng¹, Wang Dan¹, Song Bai-Peng³, He Yong-Ning^{1, ‡}, Cui Wan-Zhao⁴

The TSEY calculation result with energy-dependent electron beam spot size. Points 1, 2, and 3 are defined as shown in Fig. 11. Points 1-0, 1, 2-0, 2, 3-0, and 3 are uniformly distributed in the same row with an interval of 0.25 mm.