Secondary electron yield suppression using millimeter-scale pillar array and explanation of the abnormal yield

Secondary electron yield suppression using millimeter-scale pillar array and explanation of the abnormal yield–energy curve

Ye Ming^{1, 2, †}, Feng Peng¹, Wang Dan¹, Song Bai-Peng³, He Yong-Ning^{1, ‡}, Cui Wan-Zhao⁴

The dependence of simulated TSEY on primary electron energy using spot size in Fig. 9. Namely, the spot size changes with primary electron energy. Other parameters are set as close to experiments as possible. The estimated radiation locations used here are described as follows.