Research on SEE mitigation techniques using back junction and p<sup>+</sup> buffer layer in domestic non-DTI SiGe HBTs by TCAD

Research on SEE mitigation techniques using back junction and p⁺ buffer layer in domestic non-DTI SiGe HBTs by TCAD

Wei Jia-Nan, He Chao-Hui, Li Pei, Li Yong-Hong

Plot of collector charge collection of back junction device versus D_n for P1 and P2.