Research on SEE mitigation techniques using back junction and p+ buffer layer in domestic non-DTI SiGe HBTs by TCAD
Profile of electron current density at 1 ns when heavy ion strikes at P2.
Research on SEE mitigation techniques using back junction and p+ buffer layer in domestic non-DTI SiGe HBTs by TCAD |
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Profile of electron current density at 1 ns when heavy ion strikes at P2. |
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