Research on SEE mitigation techniques using back junction and p+ buffer layer in domestic non-DTI SiGe HBTs by TCAD
Plots of collector charge collection as a function of ion strike position for SiGe HBT with different structures.
Research on SEE mitigation techniques using back junction and p+ buffer layer in domestic non-DTI SiGe HBTs by TCAD |
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Plots of collector charge collection as a function of ion strike position for SiGe HBT with different structures. |
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