Nonlocal effect on resonant radiation force exerted on semiconductor coupled quantum well nanostructures
Zhang Jin-Ke1, 2, Zhang Ting-Ting1, 2, Zhang Yu-Liang1, 2, Wang Guang-Hui1, 2, †, Deng Dong-Mei1, 2
       

Maximum resonant radiation force (Fx and Fz) versus the incident angle θ in the two cases of p-polarization [(a) and (b)], and s-polarization [(c) and (d)] for three different well-width ratios, respectively, with the left well width LL=5 nm, and the barrier height V1=V2=2.0 meV, Γ 0 = 4.7 meV .