Nonlocal effect on resonant radiation force exerted on semiconductor coupled quantum well nanostructures
Zhang Jin-Ke1, 2, Zhang Ting-Ting1, 2, Zhang Yu-Liang1, 2, Wang Guang-Hui1, 2, †, Deng Dong-Mei1, 2
       

The change of maximum resonant radiation force (Fx and Fz) versus the barrier height ratio V1/V2 for three different well width ratios: LR/LL=2.5/5, 5/5, 7.5/5 in the two cases of p-polarization [(a) and (b)] and s-polarization [(c) and (d)], respectively, with the left well width LL=5 nm, and the outer barrier height V2=2.0 meV, Γ 0 = 4.7 meV .