Nonlocal effect on resonant radiation force exerted on semiconductor coupled quantum well nanostructures
Zhang Jin-Ke1, 2, Zhang Ting-Ting1, 2, Zhang Yu-Liang1, 2, Wang Guang-Hui1, 2, †, Deng Dong-Mei1, 2
       

Resonant radiation force spectra (Fx dashed lines; Fz solid lines) in the two cases of p- and s-polarization for two different width ratios: LR/LL=2.5/5 (black lines), LR/LL=7.5/5 (red lines) [panels (a) and (b)], and for the three different CQWN widths: LR=LL=3 nm (black lines), LR=LL=5 nm (red lines), and LR=LL=7 nm (blue lines) [panels (c) and (d)]. The mid-barrier width LB=1 nm, and the barrier height V1=V2=2.0 meV, Γ 0 = 4.7 meV .