High-performance waveguide-integrated Ge/Si avalanche photodetector with small contact angle between selectively epitaxial growth Ge and Si layers
Du Xiao-Qian1, 2, Li Chong3, Li Ben3, Wang Nan1, 2, Zhao Yue1, 2, Yang Fan1, 2, Yu Kai1, 2, Zhou Lin1, 2, Li Xiu-Li1, 2, Cheng Bu-Wen1, 2, Xue Chun-Lai1, 2, †
       

Normalized RF response for (a) APD-3.0 and (b) APD-1.5 with 20- μ m -length structure at reverse bias of 15 V, 20 V, 23 V, and 25 V.