Modeling electric field of power metal-oxide-semiconductor field-effect transistor with dielectric trench based on Schwarz–Christoffel transformation
Wang Zhi-Gang, Liao Tao, Wang Ya-Nan
       

The electric field distributions along AO1BCO2D around the trench of the three types of the trench MOSFETs with the structure parameters as listed in Table 2. (The doping concentrations Nd, N p i and N n i of trench MOSFET1 are 4.5 × 1015 cm−3, 3.3 × 1016 cm−3 and 5.0 × 1015 cm−3, respectively. The doping concentration Nd of trench MOSFET2 and MOSFET3 is 4.3 × 1015 cm−3 and 3 × 1014 cm−3, respectively. Breakdown voltage of the trench MOSFET1, MOSFET2, and MOSFET3 is 588 V, 432 V and 311 V, respectively.)