Two-step growth of VSe2 films and their photoelectric properties
Zeng Yu1, Zhang Shengli1, Li Xiuling1, Ao Jianping1, Sun Yun1, Liu Wei1, Liu Fangfang1, Gao Peng2, Zhang Yi1, †
       

XPS spectra of (a) V 2p and (b) Se 3d regions for the sample of the 50 nm thickness V films selenized at 400 °C.